The high-intensity option of the SANS diffractometer KWS-2 at JCNS – characterization and performance of the new multi-megahertz detection system

Houston, J.E.; Brandl, G.; Drochner, M.; Kemmerling, G.; Engels, R.; Papagiannopoulos, A.; Sarter, M.; Stadler, A.; Radulescu, A.

doi:10.1107/S1600576718004132

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 8
The standard deviation and statistical uncertainty calculated for each pixel of a long ³He tube based on 20 similar measurements, 0.5 h each, carried out on a Plexiglas sample with an overall count rate of 125 kHz.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 2| April 2018| Pages 323-336

https://doi.org/10.1107/S1600576718004132

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