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Figure 1
Technical drawing of the developed sample holder (a) and the setup for the in situ synchrotron X-ray total scattering experiment (b).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 3| June 2018| Pages 796-801
https://doi.org/10.1107/S1600576718005101
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