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Figure 4
Combined MAUD Rietveld texture analysis of the limestone reference sample using all of the TOF neutron diffraction patterns collected at different nominal diffraction angles [(a), (b) 2θ = 80°; (c), (d) 2θ = 90°; (e), (f) 2θ = 100°] through panel-region divisions and sample rotations. (a), (c), (e) The averaged TOF neutron diffractograms, the Rietveld fitted patterns and their residual plots. (b), (d), (f) The two-dimensional mappings for the measured diffractograms (lower) and their Rietveld fitted profiles (upper).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 3| June 2018| Pages 746-760
https://doi.org/10.1107/S1600576718004004
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