High stereographic resolution texture and residual stress evaluation using time-of-flight neutron diffraction

Xu, P.G.; Harjo, S.; Ojima, M.; Suzuki, H.; Ito, T.; Gong, W.; Vogel, S.C.; Inoue, J.; Tomota, Y.; Aizawa, K.; Akita, K.

doi:10.1107/S1600576718004004

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
(a) Measured, (b) recalculated (ODF resolution = 15°) and (c) recalculated (ODF resolution = 10°) crystallographic orientation pole figures for the limestone reference sample in equal-area projection obtained from the TAKUMI TOF neutron diffractometer at J-PARC, compared with (d), (e) the recalculated pole figures (ODF resolution = 10°) from the HIPPO TOF neutron diffractometer at LANSCE with 2θ = 150, 90, 40° diffraction rings composed of different bank panels, (d) four sample rotations and (e) eight sample rotations.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 3| June 2018| Pages 746-760

https://doi.org/10.1107/S1600576718004004

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