High stereographic resolution texture and residual stress evaluation using time-of-flight neutron diffraction

Xu, P.G.; Harjo, S.; Ojima, M.; Suzuki, H.; Ito, T.; Gong, W.; Vogel, S.C.; Inoue, J.; Tomota, Y.; Aizawa, K.; Akita, K.

doi:10.1107/S1600576718004004

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 6
Martensite (200) crystallographic orientation pole figures of the multilayered steel (d range ∼0.7–2.3 Å) in equal-area projection. Here, the pattern grid is the misorientation in stereographic angle (χ, ϕ) between neighboring neutron diffractograms, and the resolution is the stereographic resolution to obtain a neutron diffractogram. The ODF resolution is the ODF cell size during Rietveld pole figure analysis. White open triangles denote {111}〈112〉 components and red open squares denote {100}〈011〉 components.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 3| June 2018| Pages 746-760

https://doi.org/10.1107/S1600576718004004

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page