High stereographic resolution texture and residual stress evaluation using time-of-flight neutron diffraction

Xu, P.G.; Harjo, S.; Ojima, M.; Suzuki, H.; Ito, T.; Gong, W.; Vogel, S.C.; Inoue, J.; Tomota, Y.; Aizawa, K.; Akita, K.

doi:10.1107/S1600576718004004

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 7
φ₂ = 45° ODF_Bunge sections of (a)–(d) martensite and (e)–(h) austenite textures in the multilayered steel sample obtained at an ODF resolution of 5°. (a), (e) RESA-2 AD neutron diffraction with a one-dimensional PSD (Xu et al., 2012

) and individual peak fitting. (b), (f) TAKUMI TOF neutron diffraction (1800 diffractograms), individual peak fitting, pattern grid 4 × 5°, panel-region stereographic resolution 4.0 × 5.5°. (c), (g) TAKUMI TOF neutron diffraction (1800 diffractograms, i.e. Case I), Rietveld texture analysis, pattern grid 4 × 5°, panel-region stereographic resolution 4.0 × 5.5°. (d), (h) TAKUMI TOF neutron diffraction (525 diffractograms, i.e. Case II), Rietveld texture analysis, pattern grid 4 × 5°, panel-region stereographic resolution 4.0 × 5.5°.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 3| June 2018| Pages 746-760

https://doi.org/10.1107/S1600576718004004

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