Size–strain separation in diffraction line profile analysis

Scardi, P.; Ermrich, M.; Fitch, A.; Huang, E.-W.; Jardin, R.; Kuzel, R.; Leineweber, A.; Mendoza Cuevas, A.; Misture, S.T.; Rebuffi, L.; Schimpf, C.

doi:10.1107/S1600576718005411

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
Comparison of counting statistics of the different data sets, expressed as standard deviation of the intensity distribution (Klug & Alexander, 1974

), $[{\sigma _{\rm P}} = ( N_{\rm T} + N_{\rm B})^{1/2}/(N_{\rm T} - N_{\rm B})]$ , where N_T and N_B are, respectively, total and background intensity.

JOURNAL OF
APPLIED
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ISSN: 1600-5767

Volume 51| Part 3| June 2018| Pages 831-843

https://doi.org/10.1107/S1600576718005411

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