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Figure 1
Height of the gauge volume (hgv) immersed in the sample compared with the information depth in real space 〈z〉R and in Laplace space 〈z〉Lap. Different modes of X-ray and synchrotron diffraction are shown: (a) the narrow-slit configuration with small gauge and (b) wide-slit configurations (AD – angular dispersion; ED – energy dispersive) for which the information depth 〈z〉Lap is defined by equation (3[link]) and D denotes the thickness of the sample.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 3| June 2018| Pages 732-745
https://doi.org/10.1107/S1600576718004193
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