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Figure 11
The depth-dependent profile of stresses determined for (a) polished and (b) ground samples (Ti grade 2). Comparison of the results from a classical diffractometer (MGIXD), synchrotron EDDI experiment (MMXD) and the standard ED stress measurements.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 3| June 2018| Pages 732-745
https://doi.org/10.1107/S1600576718004193
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