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Figure 12
The depth-dependent profile (in the range 0–14 µm) of lattice parameter a0 for (a) polished and (b) ground samples. Comparison of the results from a classical diffractometer (MGIXD) and synchrotron EDDI experiment (MMXD).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 3| June 2018| Pages 732-745
https://doi.org/10.1107/S1600576718004193
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