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Figure 2
Geometry of the multireflection grazing incidence diffraction method. (a) The incidence angle α is fixed during measurement while the orientation of the scattering vector is characterized by the angle ψhkl. (b) Variation of the beam intensity with the depth (z) below the surface and definition of information depth τ1/e.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 3| June 2018| Pages 732-745
https://doi.org/10.1107/S1600576718004193
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