A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

Marciszko, M.; Baczmański, A.; Klaus, M.; Genzel, C.; Oponowicz, A.; Wroński, S.; Wróbel, M.; Braham, C.; Sidhom, H.; Wawszczak, R.

doi:10.1107/S1600576718004193

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
$[\langle a{(\phi, \psi)\rangle _{\{ hkl\} }}]$ versus sin²ψ plots for the mechanically polished Ti sample, measured with α = 5°. In figures (a) and (b) the theoretical plots were fitted to the experimental points determined with assumed c₀/a₀ values, whereas in the case of figure (c) the c₀/a₀ parameter was adjusted. An uncertainty of the peak position δ(2θ) = 0.01° was assumed.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 3| June 2018| Pages 732-745

https://doi.org/10.1107/S1600576718004193

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