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Figure 9
Example of [\langle a{(\phi, \psi)\rangle _{\{ hkl\} }}] versus sin2ψ plots obtained using multireflection analysis for a polished Ti sample. The lines represent mean values of theoretical [\langle a{(\phi, \psi)\rangle_{\{ hkl\} }} ] parameters over all available reflections, while the experimental data are shown using different colours for different hkl reflections.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 3| June 2018| Pages 732-745
https://doi.org/10.1107/S1600576718004193
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