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Figure 1
Simulated reflectivity curve of a 10 Å thick iron layer on top of an Si substrate with wavelength [\lambda = 4.5] Å. Left: perfect collimation and wavelength resolution. Right: relaxed collimation of 3 mrad and wavelength resolution of 10%. As there is nearly no difference visible, thin layers can be easily measured with a relaxed wavelength resolution without losing too much information.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 3| June 2018| Pages 646-654
https://doi.org/10.1107/S1600576718006994
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