The high-intensity reflectometer of the Jülich Centre for Neutron Science: MARIA

Mattauch, S.; Koutsioubas, A.; Rücker, U.; Korolkov, D.; Fracassi, V.; Daemen, J.; Schmitz, R.; Bussmann, K.; Suxdorf, F.; Wagener, M.; Kämmerling, P.; Kleines, H.; Fleischhauer-Fuß, L.; Bednareck, M.; Ossoviy, V.; Nebel, A.; Stronciwilk, P.; Staringer, S.; Gödel, M.; Richter, A.; Kusche, H.; Kohnke, T.; Ioffe, A.; Babcock, E.; Salhi, Z.; Bruckel, T.

doi:10.1107/S1600576718006994

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 7
The vertical beam profile of the elliptical vertically focusing neutron guide at the sample position. The plateau of the focused beam is clearly seen and has a height of 106 channels, amounting to 21 mm as the imaging plate is binned to 200 µm per channel.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 3| June 2018| Pages 646-654

https://doi.org/10.1107/S1600576718006994

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