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Figure 8
X-ray reflectivity curves measured before and after N2 exposure of a 2.7 nm thick lanthanum layer. Dots correspond to experimental data and fitted curves are presented as red lines. The fit parameters are summarized in Table 1[link]. To highlight the change in the oscillation period, dashed lines indicate the positions of intensity minima before N2 exposure. (b) Difference between the XRD maps after and before N2 exposure. As a result of N2 exposure, the intensity decreases at the positions of [111] f.c.c. La (white dots) and increases at the positions of [111] ZB LaN (yellow dots).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 4| August 2018| Pages 1013-1020
https://doi.org/10.1107/S1600576718007367
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