Figure 8
X-ray reflectivity curves measured before and after N2 exposure of a 2.7 nm thick lanthanum layer. Dots correspond to experimental data and fitted curves are presented as red lines. The fit parameters are summarized in Table 1 . To highlight the change in the oscillation period, dashed lines indicate the positions of intensity minima before N2 exposure. (b) Difference between the XRD maps after and before N2 exposure. As a result of N2 exposure, the intensity decreases at the positions of [111] f.c.c. La (white dots) and increases at the positions of [111] ZB LaN (yellow dots). |