Model-free classification of X-ray scattering signals applied to image segmentation

Lutz-Bueno, V.; Arboleda, C.; Leu, L.; Blunt, M.J.; Busch, A.; Georgiadis, A.; Bertier, P.; Schmatz, J.; Varga, Z.; Villanueva-Perez, P.; Wang, Z.; Lebugle, M.; David, C.; Stampanoni, M.; Diaz, A.; Guizar-Sicairos, M.; Menzel, A.

doi:10.1107/S1600576718011032

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Experimental setup: The sample is scanned across an X-ray beam along x and y. Scattering patterns are measured by a two-dimensional detector at each scanning point. The beamstop protects the detector from the direct X-ray beam.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 5| October 2018| Pages 1378-1386

https://doi.org/10.1107/S1600576718011032

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