Model-free classification of X-ray scattering signals applied to image segmentation

Lutz-Bueno, V.; Arboleda, C.; Leu, L.; Blunt, M.J.; Busch, A.; Georgiadis, A.; Bertier, P.; Schmatz, J.; Varga, Z.; Villanueva-Perez, P.; Wang, Z.; Lebugle, M.; David, C.; Stampanoni, M.; Diaz, A.; Guizar-Sicairos, M.; Menzel, A.

doi:10.1107/S1600576718011032

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
Results of WAXS segmentation for the mudrock sample. WAXS image segmentation is represented in green, while red corresponds to superficial EDX mappings. Areas where these maps overlap are represented in yellow. (a) Segmentation of representative signal S₁ and EDX mapping of calcium. (b) S₂ and sulfur. (c) S₃ and iron. (d) S₄ and silicon.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 5| October 2018| Pages 1378-1386

https://doi.org/10.1107/S1600576718011032

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