Reciprocal space mapping and strain scanning using X-ray diffraction microscopy

Poulsen, H.F.; Cook, P.K; Leemreize, H.; Pedersen, A.F.; Yildirim, C.; Kutsal, M.; Jakobsen, A.C.; Trujillo, J.X.; Ormstrup, J.; Detlefs, C.

doi:10.1107/S1600576718011378

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
Experimental reciprocal space resolution function. Projected intensity on the scattering plane. For ease of visualization the axes have different ranges. The $[(q_{{{\rm rock}^{{\prime}}}},q_{{2\theta}})]$ coordinate system is marked by black arrows and the (q_rock, q_∣∣) coordinate system in red. The contour lines represent a log₁₀ scale as marked by the colorbar to the right.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 51| Part 5| October 2018| Pages 1428-1436

https://doi.org/10.1107/S1600576718011378

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