view article
Figure 3
X-ray topographs of a [(\overline{2}01)]-oriented wafer obtained with (a) [\overline{12}\;0\;1] and (b) [\overline{6}23] reflections. Some apparent SFs are schematically depicted on the right-hand side of (a). The scale bars correspond to 100 µm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 5| October 2018| Pages 1372-1377
https://doi.org/10.1107/S1600576718011093
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS