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Figure 5
X-tay topographs obtained using various values of [{\bf g}]: (a) 606, (b) [\overline{6}23], (d) 006, (e) [\overline{6}\overline{2}6] and (f) [\overline{12}\;0\;1] reflections. (c) Schematic view of planar defects in the topographs (d)–(f). The arrows indicate the direction of X-ray incidence. The X-ray wavelength for each topograph is listed in Table 1[link].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 5| October 2018| Pages 1372-1377
https://doi.org/10.1107/S1600576718011093
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