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Figure 7
Comparison of X-ray topographs from a (001)-oriented wafer acquired with (a) [0\overline{2}6] and (b) 606 reflections. The scale bars correspond to 0.1 mm. The arrows indicate the direction of X-ray incidence.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 5| October 2018| Pages 1372-1377
https://doi.org/10.1107/S1600576718011093
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