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Figure 1
(a) XRD measurements used for modelling the Kapton film and free water. The lower intensity of the background at small angles 2θ with the addition of water (4), (5) compared to dry samples (2), (3) can be seen. (b) ZnO sample, dry and at different w/s ratios.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 6| December 2018| Pages 1535-1543
https://doi.org/10.1107/S1600576718012888
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