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Figure 2
(a) Structural model of the test system. A 30 Å-thick porous Si layer (95% Si by volume) is surrounded by aqueous solvent and suspended at a distance of 20 Å from a solid Si surface. Pores in the Si layer are solvent filled. (b) Calculated reflectivities with simulated noise for three different solvent SLD values, reflectivity curves that are best fits to the data and their associated SLD profiles (inset). The noisy data and error bars correspond to those expected in a measurement of this hypothetical sample at a current-generation reactor-based instrument such as the Magik neutron reflectometer at the NCNR. Error bars represent 68% confidence limits.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 1| February 2019| Pages 47-59
https://doi.org/10.1107/S1600576718017016
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