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Figure 7
(a) Two distinct surface structures (profile 1 and profile 2) on an Si substrate in air are indistinguishable by (non-polarized) neutron reflection, as shown by the red and black reflectivity curves in (b) (Majkrzak & Berk, 2003BB18). However, a reference layer buried beneath the surface structure [gray slab in (a) with 120 Å thickness and tunable SLD] is able to sufficiently increase the signal-to-noise ratio in the reflectivity to resolve the two profiles (blue and green curves, exemplarily shown for ρnnucl = 10 × 10−6 Å−2, ρnsplit = 0). Error bars indicate 68% confidence limits.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 1| February 2019| Pages 47-59
https://doi.org/10.1107/S1600576718017016
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