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![[Figure 1]](vh5091fig1mag.jpg)
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Figure 1
X-ray diffraction geometries for crystal structure investigations of thin films, with k0 and k as the wavevectors of the incident and scattered X-ray beams, respectively; αi is the angle of incidence, αf the out-of-plane scattering angle and θf the in-plane scattering angle. (a) Grazing-incidence X-ray diffraction, where the scattering vector is split into an in-plane component qxy and an out-of-plane component qz. (b) Specular X-ray diffraction in co-planar geometry, with αi = αf and θf = 0, where the scattering vector q consists only of a nonzero out-of-plane component qz. |
![[Figure 1]](vh5091fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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