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Figure 2
X-ray diffraction of DIP grown on a (001) substrate of HOPG. The chemical structure of the molecule is given as an inset. (a) Specular diffraction pattern of the HOPG substrate with and without DIP crystals, as well as the difference between the two patterns around the specular diffraction peak of DIP crystals. (b) Reciprocal-space map measured by grazing-incidence X-ray diffraction with a selection of peaks which were used for indexing. The centres of the triangles and the crosses give the experimental and calculated peak positions, respectively; the respective Laue indices are also given.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 2| April 2019| Pages 428-439
https://doi.org/10.1107/S1600576719003029
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