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Figure 3
X-ray diffraction of o-F2-6P, as grown on a (001) plane of HOPG; the inset gives the chemical structure of the molecule. (a) Specular diffraction pattern of the sample with the characteristic diffraction peak of the HOPG substrate and of the o-F2-6P crystals. (b) Reciprocal-space map measured by grazing-incidence X-ray diffraction. Selected peaks for the indexing procedure are marked by triangles around the maximum of the diffracted intensity; the crosses give the calculated peak positions based on indexing together with the assigned Laue indices.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 2| April 2019| Pages 428-439
https://doi.org/10.1107/S1600576719003029
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