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Figure 1
IFT calculations for D = 100, 170 and 220 Å for the simulated three-layer system. (First column) Stability plots for the determination of Λ. (Second column) Obtained profile correlation functions p(z). (Third column) Input data versus calculated regularized reflectivity. Note that the system's reflectivity is divided by the Fresnel curve corresponding to the Si/water interface.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 3| June 2019| Pages 538-547
https://doi.org/10.1107/S1600576719003534
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