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Figure 3
SEM observation in real space: (a) secondary electron emission image obtained for mono-disperse SiO2 particles and (b) section-cut profile showing the brightness for a single particle of SiO2 in (a).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 4| August 2019| Pages 783-790
https://doi.org/10.1107/S1600576719009208
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