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Figure 1
(Left) The different angles for transformation from the sample (Si, i = 1–3) to the measurement frame (Li, i = 1–3). (Right) The transformation from the crystal (Ci, i = 1–3) to the measurement frame.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 5| October 2019| Pages 1144-1156
https://doi.org/10.1107/S1600576719010720
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