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Figure 3
A diffraction pattern for Ti64 measured on D20 at Ω = 45° and χ = 90°. The artifact seen near 2Θ = 80° is caused by the detector and does not influence the results, since no hkl reflection is affected.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 5| October 2019| Pages 1144-1156
https://doi.org/10.1107/S1600576719010720
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