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Figure 1
Illustration of the parallax effect in flat-panel detectors for a single X-ray photon. At low scattering angles, the observed 2θ is the same as the actual 2θ. However, at high angles, the X-ray photon may traverse several pixels, potentially resulting in a difference between the observed and actual 2θ value. For a large number of scattered photons this will result in a broadening and shift in the centre of mass of the observed peak.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 5| October 2019| Pages 1072-1076
https://doi.org/10.1107/S1600576719011580
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