Crystallography at the nanoscale: planar defects in ZnO nanospikes

Wolff, N.; Hrkac, V.; Ditto, J.J.; Duppel, V.; Mishra, Y.K.; Johnson, D.C.; Adelung, R.; Kienle, L.

doi:10.1107/S1600576719009415

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 7
(Left) HRTEM images of the twin interfaces and (right) simulations of the inset panels for (a) the $[(0 1 {\overline 1} 1)]$ boundary and (b) the $[(0 1 {\overline 1} 3)]$ boundary using appropriate models from the supercell approach.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 52| Part 5| October 2019| Pages 1009-1015

https://doi.org/10.1107/S1600576719009415

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