Crystallography at the nanoscale: planar defects in ZnO nanospikes

Wolff, N.; Hrkac, V.; Ditto, J.J.; Duppel, V.; Mishra, Y.K.; Johnson, D.C.; Adelung, R.; Kienle, L.

doi:10.1107/S1600576719009415

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 8
(a) The new model for the atomic $[[2 {\overline 1} {\overline 1} 0]^{\rm W} / (0 1 {\overline 1} 1)]$ twin interface was tilted into a viewing direction congruent with $[[2 {\overline 1} {\overline 1} 3]^{\rm W}]$ . (b) A superposition structure was constructed by introducing mirror symmetry. (c), (d) Simulated electron diffraction data for the $[[2 {\overline 1} {\overline 1} 3]^{\rm W}]$ zone axis using an SPS with (c) and without (d) the twin, see text.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 52| Part 5| October 2019| Pages 1009-1015

https://doi.org/10.1107/S1600576719009415

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page