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Figure 2
(a) Simulated displacement field for the Laue diffraction signal on the detector, assuming a sample rotation of 0.1° about the beamline X axis (see Fig. 1[link]). The direction of the shift is shown by arrows and the magnitude of the shift by the colour scale. (b) Example Laue diffraction pattern (2048 × 2048 pixels) from an Al sample of 2.5 µm grain size. Two example ROIs used for sample rotation determination (512 × 512 pixels in size) are shown, offset by 128 pixels along both detector axes. The black dashed circle shows the limiting boundary for ROI placement.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 5| October 2019| Pages 1119-1127
https://doi.org/10.1107/S1600576719010562
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