journal menu
addenda and errata
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
Direct protein crystallization on ultrathin membranes for diffraction measurements at X-ray free-electron lasers. Corrigendum
aPaul Scherrer Institute (PSI), 5232 Villigen, Switzerland, bCenter for Cellular Imaging and NanoAnalytics (C-CINA), Biozentrum, University of Basel, Basel 4058, Switzerland, and cSwiss Nanoscience Institute, University of Basel, Basel 4056, Switzerland
*Correspondence e-mail: nadia.opara@gmail.com
Errors in the article by Opara, Martiel, Arnold, Braun, Stahlberg, Makita, David & Padeste [J. Appl. Cryst. (2017), 50, 909–918] are corrected.
Keywords: in situ crystallization; nanomembrane chips; serial femtosecond crystallography; time-resolved measurement; X-ray free-electron lasers.
In the article by Opara et al. (2017![[Opara, N., Martiel, I., Arnold, S. A., Braun, T., Stahlberg, H., Makita, M., David, C. & Padeste, C. (2017). J. Appl. Cryst. 50, 909-918.]](../../../../../../logos/arrows/j_arr.gif "Opara, N., Martiel, I., Arnold, S. A., Braun, T., Stahlberg, H., Makita, M., David, C. & Padeste, C. (2017). J. Appl. Cryst. 50, 909-918.")
), the chemical formula of the silicon nitride was given erroneously. No detailed structural analysis was performed, and no experimental evidence is provided to justify the claim that all of the silicon nitride membranes used in the presented experiments had stoichiometric composition (Yang & Pham, 2018). Therefore, the formula describing the specific case Si3N4 should be replaced with the generic formula SixNy.
In addition, there was a typographical error in the unit of ultrapure water resistivity, which should be MΩ cm.
Supporting information
Corrected version of the supporting information: table of crystallization conditions and extra figures. DOI: https://doi.org/10.1107/S1600576719013918/yr9015sup1.pdf
Footnotes
‡As of March 2019 the PSI domain corresponding author's address became obsolete; prospective questions on the content of the article can be directed to nadia.opara@gmail.com.
References
Opara, N., Martiel, I., Arnold, S. A., Braun, T., Stahlberg, H., Makita, M., David, C. & Padeste, C. (2017). J. Appl. Cryst. 50, 909–918. Web of Science CrossRef CAS IUCr Journals Google Scholar
Yang, C. & Pham, J. (2018). Silicon, 10, 2561–2567. Web of Science CrossRef CAS Google Scholar
© International Union of Crystallography. Prior permission is not required to reproduce short quotations, tables and figures from this article, provided the original authors and source are cited. For more information, click here.
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
