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Figure 7
Diffuse scattering from rough interfaces. Collimated incoming beam with λ = 1 Å, αi = 0.2°; substrate δ = 6 × 10−6, lateral correlation length ξ = 20 nm. (a) σ = 0.3 nm, H = 1; (b) σ = 1 nm, H = 0.1. In (c) and (d), the same data are integrated horizontally and vertically, respectively. The enhanced intensity below the critical angle αc = 0.198°, known as the Yoneda peak, is due to scattering from the evanescent wave.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 1| February 2020| Pages 262-276
https://doi.org/10.1107/S1600576719016789
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