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Figure 3
(a) Measured and (b) calculated 2D GISAXS images from a circular pattern of Au nanoparticles on an Si substrate at an incidence angle of 0.50°. (c) The in-plane profile obtained from the measured 2D pattern at qz = 0.80 nm−1 (red circles) and the calculated profile (black solid line). The arrow indicates the position at which the CT image was reconstructed from the intensities. (d) A cartoon of the structural model obtained from the calculation result.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 1| February 2020| Pages 140-147
https://doi.org/10.1107/S1600576719016558
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