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Figure 2
Measured Mueller matrix spectra of the {001} growth sector of a 420 µm thick c-cut mixed crystal of EDS0.46Se0.54 (Sample E) from 300 to 750 nm for four angles of incidence: 0° (green), 10° (purple), 20° (red) and 30° (blue).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 1| February 2020| Pages 51-57
https://doi.org/10.1107/S1600576719015863
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