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Figure 1
A schematic of the geometry of the residual stress measurement by synchrotron XRD. At the beginning of the measurement, the sample surface was aligned parallel to the incident beam at a grazing angle. The sample was moved perpendicular to the beam to illuminate sections through the thickness of the top coat and the bond coat. Axes 1, 2 and 3 represent the coordinates of the sample, while the X, Y and Z axes represent the coordinates of the equipment.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 1| February 2020| Pages 69-75
https://doi.org/10.1107/S1600576719016327
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