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Figure 3
Measured XRPD patterns of the NCA-precursor materials. The patterns in the main part are stacked by adding 2000 counts to each one; the patterns in the inset are not stacked.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 1| February 2020| Pages 76-87
https://doi.org/10.1107/S1600576719016212
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