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Figure 4
Graphical result of a Rietveld refinement of the diffraction pattern of the NCA-precursor material sample L002 using a faultless brucite-type structure model. The 010 reflection was used to model the contribution of the crystallite size to the peak shapes. Selected reflection indices and the positions of the related lattice planes in the crystal structure (top) are given.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 1| February 2020| Pages 76-87
https://doi.org/10.1107/S1600576719016212
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