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Figure 1
Alignment (slope θ and distance [\varrho] from the pattern centre PC′) of lattice-plane traces Ti. φ describes the angle (essential for EBSD) between the lattice-plane normals Ri* which result from the vector product Ti × R.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 2| April 2020| Pages 435-443
https://doi.org/10.1107/S1600576720000692
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