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Figure 7
1D SANS profiles of 100 nm silica NPs collected at two different sample angles. The scattering profile corrected by multiplying each data point of the sample measured at a 45° angle by 1 mm × 21/2 is perfectly coincident with that collected at a 90° angle.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 3| June 2020| Pages 722-733
https://doi.org/10.1107/S1600576720005208
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