view article

Figure 2
Illustration of the X-ray speckle tracking (XST) principle. Top: as in Fig. 1[link]. Middle: as in Fig. 1[link], with the binary mask replaced by a random phase/absorption mask (dashed outline). Bottom: sub-regions of the measured shadow image (solid black line) are compared with the reference shadow image (dashed blue line) to determine displacements (black arrows).

Journal logoJOURNAL OF
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds