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Figure 2
Illustration of the X-ray speckle tracking (XST) principle. Top: as in Fig. 1[link]. Middle: as in Fig. 1[link], with the binary mask replaced by a random phase/absorption mask (dashed outline). Bottom: sub-regions of the measured shadow image (solid black line) are compared with the reference shadow image (dashed blue line) to determine displacements (black arrows).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 3| June 2020| Pages 760-780
https://doi.org/10.1107/S1600576720005567
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