view article

Figure 11
(a) The Fourier ring correlation calculated from Fig. 10[link](d). The half-bit criterion yields a half-pitch resolution of 8.6 nm. (b) The line profile extracted from the same image [cf. orange dashed line in Fig. 10[link](d)], yielding an edge width of about 13 nm (FWHM).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds