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Figure 14
(a) A schematic diagram of the sample environment for in situ ptychography with a limited tilting angle, including the MEMS chip sample holder (Fam et al., 2019BB11). (b) A SEM image acquired during FIB–SEM showing a CoMn2O4 spinel `hollow-sphere' particle of approximately 3 µm diameter attached to the viewing window of the MEMS chip.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 4| August 2020| Pages 957-971
https://doi.org/10.1107/S1600576720008420
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