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Figure 6
Characterization of a nanofocused X-ray beam by ptychography using the previous nanoprobe setup on beamline P06. (a) The illumination and object function were reconstructed using the ePIE algorithm. (b) Caustics of the nanofocused X-ray beam in the vertical and horizontal planes.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 4| August 2020| Pages 957-971
https://doi.org/10.1107/S1600576720008420
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