Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals

Gradwohl, K.-P.; Danilewsky, A.N.; Roder, M.; Schmidbauer, M.; Janicskó-Csáthy, J.; Gybin, A.; Abrosimov, N.; Sumathi, R.R.

doi:10.1107/S1600576720005993

Journal of Applied Crystallography Journal of Applied
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Figure 5
(a) The $[2\overline{2}0]$ topograph of the top end of the crystal grown in H₂ shows the crystal to be free of dislocations and contains a few of the striking features with a black–white contrast indicating the presence of voids. (b) The $[1\overline{3}\overline{1}]$ topograph of the same crystal (tail part), revealing a dislocation density of 2600 cm⁻² and showing no sign of voids.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 53| Part 4| August 2020| Pages 880-884

https://doi.org/10.1107/S1600576720005993

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